Event Title

Assessment of Pattern Recognition Using Lasers with CMOS Imaging Arrays

Location

CSU 253/4/5

Start Date

4-4-2011 1:30 PM

End Date

4-4-2011 3:00 PM

Student's Major

Electrical and Computer Engineering and Technology

Student's College

Science, Engineering and Technology

Mentor's Name

William Hudson

Mentor's Department

Electrical and Computer Engineering and Technology

Mentor's College

Science, Engineering and Technology

Description

Using CMOS camera arrays and multiple colors of lasers we determined the ability of CMOS imaging arrays to collect images and the feasibility of accurately determining the laser beam strike point through software pattern recognition. The laser and sensor arrays were tested in varying scenarios with variability of distance, angle of incidence, background color, and target regularity used as variables. Initial testing occurred with three different colored lasers on a black and white gridline target to identify the accuracy of the pattern recognition. Once baseline accuracy had been established under near perfect conditions the variables listed above were systematically added and evaluated as to their impact on the ability to accurately locate the laser do on the target. It was anticipated that targets with non-perpendicular angles of incidence would cause the most difficulty with their resulting laser splash that had to be factored into the pattern recognition.

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Apr 4th, 1:30 PM Apr 4th, 3:00 PM

Assessment of Pattern Recognition Using Lasers with CMOS Imaging Arrays

CSU 253/4/5

Using CMOS camera arrays and multiple colors of lasers we determined the ability of CMOS imaging arrays to collect images and the feasibility of accurately determining the laser beam strike point through software pattern recognition. The laser and sensor arrays were tested in varying scenarios with variability of distance, angle of incidence, background color, and target regularity used as variables. Initial testing occurred with three different colored lasers on a black and white gridline target to identify the accuracy of the pattern recognition. Once baseline accuracy had been established under near perfect conditions the variables listed above were systematically added and evaluated as to their impact on the ability to accurately locate the laser do on the target. It was anticipated that targets with non-perpendicular angles of incidence would cause the most difficulty with their resulting laser splash that had to be factored into the pattern recognition.

Recommended Citation

Morness, Erik and Dexter Jenson. "Assessment of Pattern Recognition Using Lasers with CMOS Imaging Arrays." Undergraduate Research Symposium, Mankato, MN, April 4, 2011.
https://cornerstone.lib.mnsu.edu/urs/2011/poster-session-C/20