High-Sensitivity Far-Ultraviolet Imaging Spectroscopy with the SPRITE Cubesat
Document Type
Conference Proceeding
Publication Date
9-9-2019
Abstract
The SPRITE cubesat is a recently selected NASA astrophysics mission designed to measure ionizing radiation escape from star-forming galaxies, and to map far-ultraviolet (1000 - 1750 Å) emission from shocked regions in supernova remnants. The instrument leverages a number of new technologies identified for future large mission concepts, including the LUVOIR surveyor, to achieve the required performance. These include high broadband reflectivity mirror coatings and an ultra-low background photon counting microchannel plate detector with an anti-coincidence particle rejection system. SPRITE will serve as a flight testbed for these technologies, employing a robust calibration program as part of the principal science mission to advance the technology readiness level (TRL) to 7+ and provide heritage for future Explorer-class and larger missions. SPRITE is a 6U class cubesat funded through NASA ROSES with an anticipated launch date in 2022. The science data products will be archived on the Mikulski Archive for Space Telescopes (MAST). This proceedings describes the instrument science program, optical design, preliminary performance projections, and project timeline.
Department
Physics and Astronomy
Print ISSN
0277-786X
Online ISSN
1996-756X
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Conference Name
SPIE Optical Engineering + Applications
Conference Place
San Diego, California
Recommended Citation
Fleming, B., France, K., Williams, J., Ulrich, S., Tumlinson, J., McCandliss, S., O'Meara, J., sankrit, R., Borthakur, S., Jaskot, A., Rutkowski, M. J., Quijada, M., Hennessy, J., & Siegmund, O. (2019, September 9). High-sensitivity far-ultraviolet imaging spectroscopy with the SPRITE Cubesat [Conference session]. SPIE Optical Engineering + Applications, San Diego, CA. https://doi.org/10.1117/12.2529512
DOI
10.1117/12.2529512
Link to Publisher Version (DOI)
Publisher's Copyright and Source
Copyright © 2019. Society of Photo-Optical Instrumentation Engineers (SPIE).